Instruments

Atomic Force Microscopy (AFM) or Scanning Probe Microscopy (SPM) routinely achieves resolution of nanometers and beyond, more than 1000 times better than the optical diffraction limit. Digital images are obtained by scanning a small probe across the sample in a line-by-line fashion. Information of 3D topography and surface forces is obtained by “feeling” or “touching” the surface with an ultrasharp mechanical probe, analogous to how a blind person can feel the shape, temperature, smoothness, or roughness of a surface with their hand. Piezoelectric elements within the scanner are used to actuate and control tiny, nanoscale movements of a mechanical probe across a sample to enable precise scanning.

Atomic Force Microscope (Agilent)

PicoSPM (RHK)

Nikon Inverted Microscope

The scanning probe microscopes in Dr. Garno’s laboratory are dedicated for research activities by graduate and undergraduate students in the College of Science, as well as the College of Engineering at LSU. The instruments have specialized software for nanometer-scale lithography, and are equipped with interchangeable atomic force microscopy (AFM) scanners. The systems include a video microscope, magnetic MAC- Mode and AC-Mode controllers, and scanheads with magnification capabilities ranging from 1 to 80 microns. The scanners are mounted in vibration isolation chambers and can be operated in ambient or liquid environments. The instruments are capable of multiple measurement modes including scanning tunneling microscopy (STM), contact mode AFM, lateral force microscopy, tapping-mode and phase imaging, Kelvin Probe measurements and current sensing AFM. There is also a heated sample stage accessory that can be used with the instruments in ambient or liquid environments.